Impact of External Magnetic Fields on STT-MRAM: an Application Note

Bernard Dieny, Sanjeev Aggarwal,Vinayak Bharat Naik,Sebastien Couet,Thomas Coughlin,Shunsuke Fukami,Kevin Garello, Jack Guedj,Jean Anne C. Incorvia, Laurent Lebrun, Kyung-Jin Lee, Daniele Leonelli,Yonghwan Noh, Siamak Salimy,Steven Soss, Luc Thomas, Weigang Wang,Daniel C. Worledge

IEEE Electron Devices Magazine（2024）

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