Preparation and Measurement of an X-Ray Laue-type Monochromator Based on a WSi2/Si Multilayer.

The Laue-type multilayer monochromator (LMM) is a promising optical element with a small size and high efficiency in a synchrotron radiation facility. By the dynamical diffraction theory, using DC magnetron sputtering technology, an LMM with a total thickness of 47 µm and a periodic thickness of 4.7 nm WSi2/Si multilayer at 26 keV is designed and fabricated. During the preparation, the total number of layers is up to 20000, and every 300th layer of Si is replaced by WSi2 as the marker, so the multilayer is divided into 67 areas. The cross section of the multilayer is measured by a scanning electron microscope (SEM), and the marker region thickness error is 0.28% (RMS). The diffraction test experiment of the LMM is carried out at the Shanghai synchrotron radiation facility (SSRF). The 1st-order peak angle is 5.05 mrad, and the efficiency is 75.0%, which is close to the theoretical calculation result of 5.1 mrad and 79.1%. The Darwin width of the LMM is 0.17 mrad which is equal to the theoretical calculation. Based on the Bragg’s diffraction equation, the energy resolution (ΔE/E) is 3.3%.