Structural and Morphological Characterization of Iridium and Ir/Au Films for Transition Edge SensorsEdvige Celasco,L. Ferrari Barusso, M. De Gerone, G. Gallucci,Daniele Grosso,P. Manfrinetti, K. Niazi,Luca Repetto, F. GattiJournal of low temperature physics(2024)引用 0|浏览2暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要