The DESI One-Percent Survey: Evidence for Assembly Bias from Low-Redshift Counts-in-Cylinders Measurements
Alan N. Pearl,Andrew R. Zentner,Jeffrey A. Newman,Rachel Bezanson,Kuan Wang,John Moustakas,Jessica N. Aguilar,Steven Ahlen,David Brooks,Todd Claybaugh,Shaun Cole,Kyle Dawson,Axel de la Macorra,Peter Doel,Jamie E. Forero-Romero,Satya Gontcho,Klaus Honscheid,Martin Landriau,Marc Manera,Paul Martini,Aaron Meisner,Ramon Miquel,Jundan Nie,Will Percival,Francisco Prada,Mehdi Rezaie,Graziano Rossi,Eusebio Sanchez,Michael Schubnell,Benjamin A. Weaver,Gregory Tarle,Zhimin Zhou ASTROPHYSICAL JOURNAL（2024）
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Disassembly Sequencing,Surface Defect Detection,Tolerance Analysis,Fabric Defect Detection
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