Challenges in Atom Probe Tomography Instrumentation and Reconstruction
Microscopy and Microanalysis(2021)
摘要
Atom probe tomography (APT) has been incorporated into a wide variety of materials research applications over the course of the past twenty years as the installed base of atom probes has increased from single digits to over one hundred [1]. Despite this increase, and the corresponding technology advances, there are still challenges to further adoption. This abstract discusses some of the key challenges
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关键词
atom probe tomography instrumentation
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