Rapid MOSFET Contact Resistance Extraction From Circuit Using SPICE-Augmented Machine Learning Without Feature Extraction

It is desirable to monitor the degradation of integrated circuits (ICs) or perform their failure analysis through their electrical characteristics [such as the voltage-transfer characteristic (VTC), of an inverter]. Such a method is nondestructive, low-cost, and can be applied to a large number of samples. Machine learning is naturally an excellent tool to perform this task. However, it is very ex...