Visible Light Probing Sample Thinning Using Targeted Lapping
ISTFA 2016: CONFERENCE PROCEEDINGS FROM THE 42ND INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS(2016)
摘要
Visible Light (or Laser) Probing (VLP) is an exciting new development in Laser Voltage Probing (LVP) technology because it promises a dramatic improvement in resolution over current Near Infrared (NIR) solutions [1-3]. To have adequate visible light transmission for waveform probing and modulation mapping, however, ultrathinning of the silicon backside to <2-5 gm is required. The use of solid immersion lens (SIL) technology places additional requirements on sample preparation. In this paper, we present a simple, SIL compatible technique for VLP sample preparation.
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