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Twisted Bilayer Graphene: A Versatile Fabrication Method and the Detection of Variable Nanometric Strain Caused by Twist-Angle Disorder

Andreij C. Gadelha,Douglas A. A. Ohlberg,Fabiano C. Santana,Gomes S. N. Eliel,Jessica S. Lemos,Vinicius Ornelas,Daniel Miranda,Rafael Battistella Nadas,Kenji Watanabe,Takashi Taniguchi,Cassiano Rabelo,Pedro Paulo de Mello Venezuela,Gilberto Medeiros-Ribeiro,Ado Jorio,Luiz Gustavo Cancado,Leonardo C. Campos

ACS APPLIED NANO MATERIALS（2021）

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关键词
twisted bilayer graphene,tear-and-stack method,strain,scanning microwave impedance microscopy,scanning tunneling microscopy,nano-Raman
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