CHARACTERIZATION OF SPUTTERED ZnO BLOCKING LAYERS WITH SURFACE PLASMON RESONANCE METHOD

Thickness and dielectric permittivity of nanoscale polycrystalline ZnO films were revealed with a surface plasmon resonance (SPR) method using spectroscopic ellipsometry data [1]. The UV-Vis absorption spectra of the ZnO films were measured, and their bandgaps were evaluated from the fundamental absorption edge. Performed research allowed us to determine the sputtering regimes of nanoscale ZnO films that are promising for use as a blocking layer in a planar perovskite-based solar cells.