TEM STUDIES OF BURIED HETEROSTRUCTURE LASER-DIODES BEFORE AND AFTER OVERSTRESS TESTING

U BANGERT,ATR BRIGGS, AR GOODWIN,P CHARSLEY

INSTITUTE OF PHYSICS CONFERENCE SERIES（1991）

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摘要

Transmission electron microscopy studies have been carried out on degraded buried heterostructure lasers and unaged controls. Degradation was produced by deliberately overstressing the lasers at high currents and high temperatures.

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