Compact focusing spectrometer : Visible ( 1 eV ) to hard x-rays ( 200 keV ) a )

J. Lu, M. Bitter, K. W. Hill, L. F. Delgado-Aparicio, P. C. Efthimion,N. A. Pablant, P. Beiersdorfer, T. A. Caughey, J. Brunner

semanticscholar(2014)

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摘要
X-ray tests of a two-dimensional stigmatic imaging scheme with variable magnificationsa) J. Lu,1,b) M. Bitter,2 K. W. Hill,2 L. F. Delgado-Aparicio,2 P. C. Efthimion,2 N. A. Pablant,2 P. Beiersdorfer,3 T. A. Caughey,4 and J. Brunner4 1Key Laboratory of Optoelectronic Technology and System of Ministry of Education, Chongqing University, Chongqing 400030, China 2Princeton Plasma Physics Laboratory, Princeton, New Jersey 08543, USA 3Physics Division, Lawrence Livermore National Laboratory, Livermore, California 94550, USA 4Inrad Optics, 181 Legrand Avenue, Northvale, New Jersey 07647, USA
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