Comparison of Vis-NIR and SWIR hyperspectral imaging for the non-destructive detection of DON levels in Fusarium head blight wheat kernels and wheat flour
Infrared Physics & Technology(2020)
摘要
•Vis-NIR and SWIR hyperspectral imaging systems were utilized for wheat kernel and wheat flour samples.•The SVM and SAE models were built after selection optimal wavelengths by the GA method.•Vis-NIR and SWIR more accurately detect infected wheat kernel and wheat flour samples, respectively.
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关键词
Fusarium head blight,Hyperspectral imaging,Visible near-infrared,Short wave infrared,SAE network
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