A New CDM Discharge Head for Increased Repeatability and Testing Small Pitch Packages

Evan Grund, Thomas Chang, Roger Watkins, Chad Burke, Justin Katz,Robert Gauthier

Electrical Overstress/Electrostatic Discharge Symposium（2018）

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high-density packages,CDM discharge head design,internal spark discharge,CDM discharge head,small pitch packages,charged device model testing

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