Forming Operation in Ge-Rich Gexsbytez Phase Change Memories
SOLID-STATE ELECTRONICS(2017)
关键词
Phase-change memories (PCM),Ge-Sb-Te compounds,Ge-rich GST,SET drift,Forming
AI 理解论文
溯源树
样例

生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要
SOLID-STATE ELECTRONICS(2017)