Structural Properties of the Range-Ii- and Range-Iii Order in Amorphous-Sio2 Probed by Electron Paramagnetic Resonance and Raman Spectroscopy
The European physical journal B, Condensed matter physics/European physical journal B, Condensed matter and complex systems(2010)
摘要
In the present work we report an experimental investigation by electron paramagnetic resonance spectroscopy on the hyperfine structure of the E'\(_\gamma\) point defect, probing the local arrangement of the network (range-II order), and by Raman spectroscopy on the D1 and D2 lines, probing mean features of the network (range-III order). Our studies, performed on a-SiO2 samples thermally treated at 1000 °C in air for different time durations, show that changes of the hyperfine structure and of the D1 and D2 lines occur in a correlated way. These results give strong evidence that the range-II and range-III order properties are intimately related to each other and that these properties aredetermined by the history of the material.
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关键词
Raman Line,Previous Experimental Investigation,Line Amplitude,Commercial Origin,Crystalline Silicon Dioxide
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