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Structural Properties of the Range-Ii- and Range-Iii Order in Amorphous-Sio2 Probed by Electron Paramagnetic Resonance and Raman Spectroscopy

˜The œEuropean physical journal B, Condensed matter physics/European physical journal B, Condensed matter and complex systems(2010)

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摘要
In the present work we report an experimental investigation by electron paramagnetic resonance spectroscopy on the hyperfine structure of the E'\(_\gamma\) point defect, probing the local arrangement of the network (range-II order), and by Raman spectroscopy on the D1 and D2 lines, probing mean features of the network (range-III order). Our studies, performed on a-SiO2 samples thermally treated at 1000 °C in air for different time durations, show that changes of the hyperfine structure and of the D1 and D2 lines occur in a correlated way. These results give strong evidence that the range-II and range-III order properties are intimately related to each other and that these properties aredetermined by the history of the material.
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关键词
Raman Line,Previous Experimental Investigation,Line Amplitude,Commercial Origin,Crystalline Silicon Dioxide
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