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Beam Tests of Atlas Sct Silicon Strip Detector Modules

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detector...(2005)

Instituto de Microelectronica de Barcelona | University of Bergen | Lawrence Berkeley Laboratory and University of California | School of Physics and Astronomy | Cavendish Laboratory | European Laboratory for Particle Physics (CERN) | Faculty of Physics and Nuclear Techniques | The Henryk Niewodniczanski Institute of Nuclear Physics | Fakultät für Physik | Section de Physique | Department of Physics and Astronomy | Department of Physics | Institute of Particles and Nuclear Studies (IPNS) | Kyoto University of Education | J. Stefan Institute and Department of Physics | University of Melbourne | Univ Melbourne | Moscow State University | Max-Planck-Institut für Physik | NIKHEF | Physics Department | University of Oslo | Academy of Sciences of the Czech Republic (ASCR) | Charles University | Czech Technical University | Institute of High Energy Physics (IHEP) | Rutherford Appleton Laboratory | Santa Cruz Institute for Particle Physics | University of Sydney | Institute of Physics | Uppsala University | Instituto de Fisica Corpuscular (IFIC)

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Abstract
The design and technology of the silicon strip detector modules for the Semiconductor Tracker (SCT) of the ATLAS experiment have been finalised in the last several years. Integral to this process has been the measurement and verification of the tracking performance of the different module types in test beams at the CERN SPS and the KEK PS. Tests have been performed to explore the module performance under various operating conditions including detector bias voltage, magnetic field, incidence angle, and state of irradiation up to 3×1014 protons per square centimetre. A particular emphasis has been the understanding of the operational consequences of the binary readout scheme.
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ATLAS,silicon,micro-strip,detector,beam,test
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要点】:本文研究了ATLAS实验中的半导体跟踪器(SCT)硅条探测器模块的设计、技术及其在不同条件下的跟踪性能,特别关注了二元读出方案的操作影响。

方法】:通过在CERN SPS和KEK PS的测试束流中对不同模块类型进行测量和验证,评估了探测器性能。

实验】:在探测器偏置电压、磁场、入射角度和辐射状态等多种操作条件下进行了测试,数据集名称未提及,实验结果显示了模块性能及其对二元读出方案的响应。