Degradation of the Reset Switching During Endurance Testing of a Phase-Change Line Cell
IEEE Transactions on Electron Devices(2009)
摘要
In this brief, we studied the endurance properties of an integrated phase-change line cell. The different characteristics typically observed during the endurance lifetime are described. The monitoring of the switching parameters of the cell (reset current and threshold voltage) during endurance testing could be correlated with a gradual degradation of the reset switching. The following conclusions...
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关键词
Degradation,Phase change materials,Switches,Materials,Monitoring,Phase change memory,Resistance
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