Scanning-spatial-phase alignment for zone-plate-array lithography
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B(2004)
摘要
In this article, we describe a technique for level-to-level alignment in zone-plate-array lithography, that does not require an external microscope, yet provides overlay superior. to conventional microscopes. (C) 2004 American Vacuum Society.
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关键词
scanning-spatial-phase,zone-plate-array
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