On-Chip Write & Verify and Endurance Enhancer Circuits towards Multi-level RRAM Array

2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)(2024)

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摘要
In-memory computing based on multi-level RRAMs has shown great potential in neural network computations. In-situ training is becoming increasingly attractive, but requires accurate on-chip RRAM cell write. In this paper, we demonstrate a fully on-chip write and verify circuit and a novel methodology to improve the endurance of RRAM. Simulations show up to $120 \times$ programming speed improvement, achieving 86% reduction of conductance standard deviation and $50 \times$ longer device lifetime.
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关键词
in-memory computing,multi-level RRAM,write verify,endurance
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