Buyer aware: Three new failure modes in TOPCon modules absent from PERC technology

The n-type tunnel oxide passivated contact (TOPCon) technology is going to be the leading industrial technology in 2024. However, there are still concerns about the reliability of TOPCon when used in the field, especially in glass/backsheet modules. This work investigates the impact of damp heat (DH) on the performance TOPCon and PERC glass/backsheet modules by varying bills of materials (BOM), such as polyolefin elastomer (POE), ethyl-vinyl acetate (EVA), and polymer backsheet options. It is found that PERC modules remain stable, with a maximum power loss (Pmax) of only 1–2%rel after 1000 h of DH testing, regardless of the BOM used. However, TOPCon modules experienced significant degradation with a drop in Pmax ranging from 4 to 65%rel after the same testing duration. Despite utilizing POE, an expensive encapsulant with a significantly lower water vapour transmission rate than EVA and devoid of acetic acid formation, a severe performance decline was observed in a specific POE variant within TOPCon modules, with a loss of power of up to 65%rel. Three types of failures were observed in TOPCon modules: point-localized failure, failure at/around the interconnection of ribbon wires and busbars, and failure throughout the whole area of cells/modules. These failures likely result from electrochemical reactions involving moisture, cell metallization, ribbon wires, contaminants, soldering flux, and additives released from POE. The observed findings underline two crucial points: 1) the vulnerability and potential failure of TOPCon solar cells when exposed to high humidity and contaminants, and 2) the high risk associated with certain POE types, which could potentially adversely affect TOPCon cells. Hence, it is crucial to exercise utmost caution and precision in handling and selecting encapsulation materials for TOPCon modules. Accordingly, urgent and extensive research efforts are crucial to substantially increase our comprehension and fortify the reliability of TOPCon cells against the pernicious effects of moisture and other contaminants.