Characterization and Reliability Study of an Al-Doped HfO$_\text{2}$-Based High-Density 2.5-D MIMCAPEmmanuel Chery,Kristof Croes,Philip Nolmans,Eric BeyneIEEE Transactions on Electron Devices（2024）引用 0|浏览4暂无评分AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
