Direct Assessment of Defective Regions in Monolayer MoS2 Field-Effect Transistors through In Situ Scanning Probe Microscopy MeasurementsAlbert Minj,Vivek Mootheri,Sreetama Banerjee,Ankit Nalin Mehta,Jill Serron,Thomas Hantschel,Inge Asselberghs,Ludovic Goux,Gouri Sankar Kar,Marc Heyns,Dennis H. C. LinACS Nano(2024)引用 0|浏览2暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要