Robust Bichromatic Classification using Two Lines
CoRR(2024)
摘要
Given two sets 𝑅 and 𝐵 of at most 𝑛 points
in the plane, we present efficient algorithms to find a two-line linear
classifier that best separates the “red” points in 𝑅 from the
“blue” points in B and is robust to outliers. More precisely, we find a
region 𝑊_𝐵 bounded by two lines, so either a halfplane,
strip, wedge, or double wedge, containing (most of) the blue points
𝐵, and few red points. Our running times vary between optimal
O(nlog n) and O(n^4), depending on the type of region
𝑊_𝐵 and whether we wish to minimize only red outliers, only
blue outliers, or both.
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