Disentangling Tilt and Polarization Measurements in 4D-STEM Measurements of a Multilayer by Inversion of a Stacked Bloch Wave Model.

Journal Article Disentangling Tilt and Polarization Measurements in 4D-STEM Measurements of a Multilayer by Inversion of a Stacked Bloch Wave Model Get access Steven E Zeltmann, Steven E Zeltmann Department of Materials Science and Engineering, University of California, Berkeley, United States Corresponding author: steven.zeltmann@berkeley.edu Search for other works by this author on: Oxford Academic Google Scholar Shang-Lin Hsu, Shang-Lin Hsu Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, CA, United States Search for other works by this author on: Oxford Academic Google Scholar Hamish G Brown, Hamish G Brown Ian Holmes Imaging Centre, Bio21 Molecular Science and Biotechnology Institute, University of Melbourne, Victoria, Australia Search for other works by this author on: Oxford Academic Google Scholar Sandhya Susarla, Sandhya Susarla School for Engineering of Matter, Transport, and Energy, Arizona State University, Tempe, AZ, United States Search for other works by this author on: Oxford Academic Google Scholar Andrew Minor, Andrew Minor Department of Materials Science and Engineering, University of California, Berkeley, United StatesNational Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, United States Search for other works by this author on: Oxford Academic Google Scholar Colin Ophus Colin Ophus National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA, United States Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 256–257, https://doi.org/10.1093/micmic/ozad067.115 Published: 22 July 2023