SiC MOSFETs Biased C-V Curves: A Temperature Investigation

In this paper, SiC MOSFETs capacitance is monitored when a DC bias is applied between Drain and Source. The arising capacitance exhibits a sharp peak in the inversion region which is related to the SiC/SiO 2 interface traps properties. Temperature effects on such peak are investigated using both experimental and numerical results. The peak shifts toward lower Gate voltage as temperature increases, in agreement with the threshold voltage reduction at higher temperature.