Low Voltage (10 to 30 keV) CRYO-STEM-EELS: Another Step Toward a Damage-free Mapping of Li in Beam Sensitive Materials

Journal Article Low Voltage (10 to 30 keV) CRYO-STEM-EELS: Another Step Toward a Damage-free Mapping of Li in Beam Sensitive Materials Get access Nicolas Dumaresq, Nicolas Dumaresq McGill University, Montréal, Québec, Canada Corresponding author: Nicolas.dumaresq@mail.mcgill.ca Search for other works by this author on: Oxford Academic Google Scholar Nicolas Brodusch, Nicolas Brodusch McGill University, Montréal, Québec, Canada Search for other works by this author on: Oxford Academic Google Scholar Michel Trudeau, Michel Trudeau Hydro-Québec, Québec, Canada Search for other works by this author on: Oxford Academic Google Scholar Raynald Gauvin Raynald Gauvin McGill University, Montréal, Québec, Canada Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 1720–1721, https://doi.org/10.1093/micmic/ozad067.889 Published: 22 July 2023