Benchmarking Machine Learning-Derived W State Witnesses on NISQ Hardware

Alexander C. B. Greenwood,Eric Y. Zhu, Larry T. H. Wu,Brian T. Kirby,Li Qian

2023 Conference on Lasers and Electro-Optics (CLEO)（2023）

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摘要

We find that our W state witnesses derived with a Support Vector Machine have comparable noise tolerance while requiring fewer measurements than the fidelity method; this result is physically verified on an IBM Quantum Processor.

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