Exponential Accuracy Solutions of 2-D Electromagnetic Scattering From Multilayered Nonconcentric Elliptical Magnetodielectric Cylinders Under TE Illumination

In this article, we develop the fast computation algorithm for electromagnetic (EM) scattering from 2-D multilayered nonconcentric elliptical magnetodielectric cylinders illuminated by an EM wave with transverse electric (TE) polarization. The dielectric materials filling each homogeneous cylinder can be isotropic or biaxially anisotropic. Meanwhile, each elliptical cylinder is allowed to have its own axis ratio. The multilayer surface integral equations (SIEs) are first formed and then transformed into the spectral-domain expressions by expanding both the unknown boundary tangential field values and Green's functions with the Fourier series. The purpose of such a spectral integral method (SIM) is to lower the spatial sampling density (SD) along the multiple cylindrical boundaries and simultaneously maintain an exponentially decaying numerical error. Finally, the discretized matrix equations for SIM are assembled by letting the order of the Fourier series be equal to the number of total discretized points in each cylindrical boundary. Two numerical examples are presented to validate the computation accuracy and efficiency of the SIM when the material is either isotropic or biaxially anisotropic. It is found that the SIM has superiority over the traditional method of moments (MoM) for both the less computational time and exponentially decaying errors.