U-Net Implementation for High Throughput Grain Boundary Detection in Bright Field TEM Micrographs: Toward In Situ Grain Growth Studies.

Matthew J Patrick,James K Eckstein, Javier Lopez, Alan J Ma, Silvia Toderas,Stacey Levine,Katayun Barmak

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada（2023）

引用 0|浏览2

暂无评分

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要