Three-dimensional Analysis of Nanoscale Dislocation Loops with Multislice Electron Ptychography.

Journal Article Three-dimensional Analysis of Nanoscale Dislocation Loops with Multislice Electron Ptychography Get access Colin Gilgenbach, Colin Gilgenbach Massachusetts Institute of Technology, Cambridge, MA, United States Search for other works by this author on: Oxford Academic Google Scholar Xi Chen, Xi Chen Massachusetts Institute of Technology, Cambridge, MA, United States Search for other works by this author on: Oxford Academic Google Scholar Michael Xu, Michael Xu Massachusetts Institute of Technology, Cambridge, MA, United States Search for other works by this author on: Oxford Academic Google Scholar James LeBeau James LeBeau Massachusetts Institute of Technology, Cambridge, MA, United States Corresponding author: lebeau@mit.edu Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 286–287, https://doi.org/10.1093/micmic/ozad067.132 Published: 22 July 2023