Counting on the future: fast charge-integrating detectors for X-ray nanoimaging.

Junjing Deng,Antonino Miceli,Chris Jacobsen

Journal of synchrotron radiation（2023）

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摘要

A fast charge-integrating detector has been showcased for high-resolution X-ray ptychography. The advancement in developing detectors of this kind, with rapid framing capabilities, holds paramount significance in harnessing the full potential of emerging diffraction-limited synchrotron sources for X-ray nanoimaging.

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关键词

X-ray nanoimaging,coherent diffraction imaging,commentary,fast charge-integrating detectors

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