Co2Fe(Ti0.5Al0.5) epitaxial thin films: Structural and magnetic properties of a Heusler alloy with Z-site transition metal substitution

We investigate the structural, static, and dynamic magnetic properties of epitaxial Heusler Co2Fe(Ti0.5Al0.5) (CFTA) alloy thin films with thickness varying from 6 nm to 80 nm grown by sputter beam epitaxy on cubic MgO(001), MgAl2O4(001), and hexagonal Al2O3(112̄0) substrates. X-ray diffraction measurements indicate epitaxial growth of CFTA thin films with B2 chemical ordering, with cubic [001] and [220] CFTA axes normal to the cubic and hexagonal substrates, respectively. Microstructure analysis of films grown on MgO substrates reveals a uniformly oriented epitaxial crystal with small variations consistent with strain distortions, providing an explanation for the relatively large X-ray rocking curve values found. Meanwhile, films on Al2O3(112̄0) substrates reveal columnar growth with frequent in-plane grain rotations. A pronounced four-fold magnetocrystalline anisotropy is observed in epitaxial thin films grown on cubic substrates. A pronounced uniaxial anisotropy for films grown on Al2O3(112̄0) substrates is observed. A saturation magnetization of ∼5.0μB/f.u. (where f.u. represents formula unit) is obtained at room temperature, slightly smaller compared to the expected value based on the Slater-Pauling rule. Ferromagnetic resonance spectroscopy finds an effective damping parameter and inhomogeneous linewidth broadening comparable to those found in parent compound Co2FeAl, which suggests that Ti substitution can be achieved without negatively affecting the magnetic properties of the system.