Explicit Representation and Customized Fault Isolation Framework for Learning Temporal and Spatial Dependencies in Industrial Processes

IEEE TRANSACTIONS ON NEURAL NETWORKS AND LEARNING SYSTEMS(2024)

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摘要
Typically, industrial processes possess both temporal and spatial dependencies due to intravariable dynamics and intervariable couplings. The two dependencies have different manifestations, indicating diverse process characteristics. However, the existing methods fail to separate temporal and spatial information well, leading to inappropriate representation and inaccurate fault detection and isolation results. This study proposes an explicit representation and customized fault isolation framework to tackle temporal and spatial characteristics, so as to identify and locate anomalies affecting different dependencies. First, we design a double-level separation method for temporal and spatial information. In the first level, we construct two independent auto-encoding modules to extract temporal correlation and spatial graph structure in parallel. In the second level, we propose an information aliasing loss function to guild the two modules to distinguish between temporal and spatial characteristics, further facilitating information separation. By monitoring the explicit temporal and spatial statistics obtained by the two modules, spatiotemporal dependencies of anomalies can be determined for subsequent isolation. Furthermore, we propose a customized isolation strategy for anomalies in temporal and spatial characteristics. By quantifying changes in intravariable temporal dynamics and intervariable spatial graph structure individually, temporal impact and spatial propagation of faults can be finely characterized and isolated. Three examples are adopted to verify the performance of the proposed framework, including a numerical example, a real condensing system of the thermal power plant process, and the Tennessee Eastman benchmark process.
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关键词
Spatiotemporal phenomena,Anomaly detection,Feature extraction,Decoding,Process control,Fault diagnosis,Fault detection,Customized fault isolation,explicit representation,information aliasing loss,spatiotemporal dependency
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