Low Latency SEU Detection in FPGA CRAM With In-Memory ECC Checking

In harsh environments such as space, radiation and charged particles cause Single-Event Effects, faults occurring randomly on any electronic component. These must be mitigated to ensure device functionality. Modern mitigation methods, such as triple modular redundancy, are very effective against Single-Event Transients (SETs), but incur a minimum of 3x cost in area. Single-Event Upsets (SEUs) affect sequential elements and are regularly repaired using memory scrubbing. Scrubbing is a slow serial process, going through every memory word looking for errors to repair. It involves a non-negligible Time To Detect (TTD) before repair, during which other events can occur and compromise the system. Field Programmable Gate Arrays (FPGAs) rely heavily on sequential elements to store their configuration; thus, FPGA's SEU detection time is critical to ensuring design integrity in harsh conditions. In this paper, we propose In-Memory Error Code Correction Checking (IMECCC), a method to replace memory scrubbing and improve FPGA configuration memory protection in high radiation environments. Our method allows asynchronous SEU detection, and replaces the scrubbing's variable time to detect with a fixed TTD. We show that IMECCC reduces FPGA's TTD by at least 116,000x on average, with an area increase of 1.56x, using a test architecture resembling a Xilinx Virtex 5 QV at a 60MHz scrubbing frequency.