Taking Advantage of Typical Testor Algorithms for Computing Non-reducible Descriptors.

Manuel S. Lazo-Cortés, José Fco. Martínez-Trinidad,Jesús Ariel Carrasco-Ochoa,Ventzeslav Valev, Mohammad Amin Shamshiri,Adam Krzyzak

International Conference on Pattern Recognition Applications and Methods (ICPRAM)(2022)

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摘要
The concepts of non-reducible descriptor (NRD) and typical testor (TT) have been used for solving quite different pattern recognition problems, the former related to feature selection problems and the latter related to supervised classification. Both TT and NRD concepts are based on the idea of discriminating objects belonging to different classes. In this paper, we theoretically examine the connection between these two concepts. Then, as an example of the usefulness of our study, we present how the algorithms for computing typical testors can be used for computing non-reducible descriptors. We also discuss several future research directions motivated by this work.
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关键词
Non-reducible Descriptor,Typical Testor,Feature Selection
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