Conductivity and Low Frequency Noise in VOx Thin Films

The electrical conductivity, temperature coefficient of resistance (TCR), and electrical low frequency noise in VOx thin films were investigated. The electrical conduction is found to be dominated by Variable Range Hopping (VRH). Phenomenological relations between resistivity, TCR, and low frequency noise were determined for VOx films over a wide range of resistivities. It was observed that both TCR and noise increase monotonically with resistivity, as expected for VRH conduction.