A New Method to Measure Thermal Impedance for All-Active Semiconductor Lasers using the Athermalisation Condition

Dovydas Mickus,Caolan Murphy,Robert McKenna,John Donegan

Conference on Lasers and Electro-Optics（2022）

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摘要

A method for measuring thermal impedance of several laser sections at once is presented. We measured thermal impedance length product as 29.3±2.1 and 39.33±2.8 o C µm/mW for gain and grating sections respectively for our DBR lasers.

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关键词

thermal impedance,athermalisation condition,lasers,all-active

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