Fast Jitter Tolerance Testing for High-Speed Serial Links in Post-Silicon Validation

IEEE Transactions on Electromagnetic Compatibility(2022)

引用 2|浏览1
暂无评分
摘要
Post-silicon electrical validation of high-speed input/output (HSIO) links is a critical process for product qualification schedules of high-performance computer platforms under current aggressive time-to-market commitments. Improvements in signaling methods, circuits, and process technologies have allowed HSIO data rates to scale well beyond 10 Gb/s. Noise and EM effects can create multiple signa...
更多
查看译文
关键词
Jitter,Testing,Bit error rate,Measurement uncertainty,Life estimation,Silicon,Frequency measurement
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要