Bandpass NGD Time- Domain Experimental Test of Double-Li Microstrip Circuit

Rémy Vauché,Rym Assila Belhadj Mefteh,Fayrouz Haddad,Wenceslas Rahajandraibe,Fayu Wan,Sébastien Lalléchère,Glauco Fontgalland,Preeti Thakur,Atul Thakur,Blaise Ravelo

IEEE Design & Test（2022）

引用 3|浏览9

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摘要

Editor’s notes: In this article, a time-domain test on the negative group delay behavior of a double-Li-structure microstrip circuit is proposed. The feasibility of the test is validated experimentally using Gaussian envelopes modulating sine carrier frequencies inside and outside the negative group delay frequency bands. —Petru Eles, Linkoping University, Sweden

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关键词

Transmission line measurements,Time-domain analysis,Bandwidth,Scattering parameters,Prototypes,Microwave theory and techniques,Microwave circuits

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