Research of Microprocessor Electrical Fast Transient Pulse Group Testing

Lei Liu,Wenxiao Fang,Xiangjun Lu, Shuwang Dai

2021 6th International Conference on Integrated Circuits and Microsystems (ICICM)（2021）

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摘要

Electrical Fast Transient Pulse (EFT) is a kind of transient pulse interference caused by lightning, grounding fault or the switching of inductive load in circuit. Researchers from Cisco, Intel and other companies have proposed a model to simulate the EFT pulse coupling into the IC’s power pin and input/output (I/O) pin through the EFT transient disturbance rejection direction, which is used to st...

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关键词

Couplings,Micromechanical devices,Power supplies,Microcontrollers,Voltage,Interference,Pins

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