Field Plate-Adaptive Doping: A Novel Surface Electric Field Optimization Technique for SOI LDMOS With Gate Field Plate

IEEE Transactions on Electron Devices(2022)

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摘要
The tradeoff between breakdown voltage (BV) and specific ON-resistance ( ${R}_{{\mathrm{\scriptscriptstyle ON},\text {sp}}}$ ) has always been the most crucial designing indicator to power devices. In this article, based on the effective concentration profile (ECP) concept, a novel field plate-adaptive doping (FAD) technique is...
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关键词
Doping,Electric breakdown,Logic gates,Couplings,P-n junctions,Optimization,Electric potential
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