Measurement and characterization of interfacial mechanical properties of graphene/MoS2 heterostructure by Raman and photoluminescence (PL) spectroscopy

•A synergistic measurement method, in which Raman and photoluminescence (PL) spectroscopy are employed to determine the strain fields of each layer, is proposed to measure the mechanical properties of the Graphene/MoS2 heterostructure.•The strain distributions of each layer in the graphene/MoS2 double-layer heterostructure were quantitatively measured by the method.•The interfacial mechanical properties and competition mechanism between the two interfaces (Graphene-MoS2 and MoS2-substrate) are discussed.•The differences in interfacial mechanical parameters between single-layer and double-layer structures, such as critical edge length and interface strength, were further discussed, which provides experimental bases for the practical application of nano-heterostructures.