Laser Logic State Imaging Using Transient Voltage Collapse Circuits

A laser based logic state imaging (LLSI) by activating transient voltage collapse (TVC) circuits of SRAM blocks is demonstrated. In order to induce a voltage modulation on a power rail, significant numbers of TVC units are activated. The image quality of LLSI strongly depends on a number of activated TVC circuits. From this experiment, it is concluded that an additional circuit or experimental setup is not necessary for LLSI.