UTR: Unsupervised Learning of Thickness-Insensitive Representations for Electron Microscope Image

2021 IEEE International Conference on Image Processing (ICIP)（2021）

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摘要

Registration of serial section electron microscopy (ssEM) images is essential for neural circuit reconstruction. Morphologies of neurite structure in adjacent sections are different. Thus, it is challenging to extract valid features in ssEM image registration. Convolutional neural networks (CNN) have made unprecedented progress in feature extraction of natural images. However, morphological differ...

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关键词

Image registration,Scanning electron microscopy,Neurites,Neural circuits,Morphology,Feature extraction,Convolutional neural networks

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