Imbalance-Tolerant Bit-Line Sense Amplifier for Dummy-Less Open Bit-Line Scheme in DRAM

IEEE Transactions on Circuits and Systems I: Regular Papers(2021)

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摘要
In a conventional open bit-line scheme of DRAM, the edge subarrays (MATs) located at both ends of the cell array block contain alternated real and dummy bit-lines, unavoidably leading to an additional area overhead. To reduce the area overhead, one edge MAT can be eliminated by converting the dummy bit-lines of the other edge MAT into real bit-lines. This strategy causes the conventional bit-line ...
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Sensors,Capacitance,MOS devices,Latches,Computer architecture,Microprocessors,Random access memory
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