Quantifying nanoscale electromagnetic fields in multi-THz nanoscopy
2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)(2020)
摘要
We introduce a novel Fourier demodulation analysis to numerically simulate a realistic near-field microscopy scenario. The new concept allows us to access the experimentally elusive, nanoscale distributions of the demodulated electromagnetic fields in multi-THz nanoscopy. We quantify the achievable lateral resolution as well as the probing volume inside the sample and visualize the scattering process into the far field.
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关键词
achievable lateral resolution,nanoscale electromagnetic fields,novel Fourier demodulation analysis,realistic near-field microscopy scenario,nanoscale distributions,demodulated electromagnetic fields
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