The Role of Metal-Catalyzed Chemical Etching Black Silicon in the Reduction of Light- and Elevated Temperature-Induced Degradation in P-Type Multicrystalline Wafers

Light- and elevated temperature-induced degradation (LeTID) of silicon wafers reduces the energy yield of photovoltaic modules in the field. A previous study demonstrated that this degradation is greatly reduced in samples with a surface textured with black silicon formed via reactive ion etching. However, the reason for this reduction is currently not understood. This article extends that result ...