Understanding electrical breakdown in liquid helium with a statistical distribution-based studyNguyen Phan, Ben Beaumont, Nathan Bouman,Steven Clayton, Scott Currie,Takeyasu Ito,John Ramsey,George Seidel,Wanchun WeiBulletin of the American Physical Society(2020)引用 0|浏览4暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要