ExtraTime: Modeling and Analysis of Transistor Aging at Microarchitecture-Level

Long-Term Reliability of Nanometer VLSI Systems(2019)

引用 1|浏览2
暂无评分
摘要
An aging-aware design of the entire processor, including the microarchitecture, is inevitable. To achieve this goal, it is necessary to assess transistor aging already in early design phases and to balance aging with other key design aspects (performance, power, and area). However, a major challenge is that detailed transistor-level information is not yet available in these phases making an accurate wearout estimation very difficult.
更多
查看译文
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要