Fine residual stress distribution measurement of steel materials by SOI pixel detector with synchrotron X-rays

Ryutaro Nishimura,Shunji Kishimoto,Toshihiko Sasaki, Shingo Mitsui,Masayoshi Shinya,Yasuo Arai,Toshinobu Miyoshi

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment（2020）

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摘要

Residual stress is an important factor governing evaluating and controlling the quality of metal materials in industrial products. X-ray measurements provide one of the most effective means of evaluating residual stress without destruction. In such measurements, the effects of residual stress on the crystal structure can be observed through the Debye ring deformation.

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关键词

SOI,Pixel detector,Residual stress,X-ray imaging,Semiconductor detector,Synchrotron radiation

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